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About Us
History of the Technology
News
Products
Overview
Capacitive-Sensors
Eddy Current Sensors
Label Sensors
Machine Tool Sensors
Custom Solutions
Online Store
Custom Sensor Development
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Overview
Production Label Sensors | Packaging System Sensors
Semiconductor Wafer Sensing
Test/Measurement
Industrial/CNC
Life Sciences
Contact
Technical Library
Case Studies
Dynamic Non-Contact Measurement and Analysis of a Grinding Machine
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Case Studies
Dynamic Non-Contact Measurement and Analysis of Gluing Machine
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Case Studies
How the Measurement of Spindle Axis Motion Provides Valuable Advantages to the Super Precision Spindle
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Case Studies
Integrated Spindle Runout Measurement
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Case Studies
Rotary Table Measurement Comparison
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Case Studies
SEMI SILICON WAFER THICKNESS
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Case Studies
Single Sensor for Detection of all Types for a Pharmaceutical and Chemical Manufacturer
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Case Studies
Spindle Dynamic Performance Measurement for a Spindle Manufacturer
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Case Studies
Using a 5-Channel CPL230 to Measure Vibration of a Bearing in Multiple Axes
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