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About Us
History of the Technology
News
Products
Overview
Capacitive-Sensors
Eddy Current Sensors
Label Sensors
Machine Tool Sensors
Custom Solutions
Online Store
Custom Sensor Development
Technical Library
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Overview
Production Label Sensors | Packaging System Sensors
Semiconductor Wafer Sensing
Test/Measurment
Industrial/CNC
Aerospace & Defense
Life Sciences
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Technical Library
Application Notes
How the Spindle Error Analyzer Works
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Application Notes
Linear Position and Displacement Measurement With Capacitive and Eddy-Current Sensors
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Application Notes
NASA Next Generation X-Ray Optics Mirror Installation with Capacitive Sensors
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Application Notes
Production Line Part Sorting
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Application Notes
Shaft Runout Measurement With Noncontact Displacement Sensors
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Application Notes
Thickness Measurement With Noncontact Sensors
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Application Notes
Top Dead Center Application
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Application Notes
Using Eddy-Current Sensors for Thread Detection
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Application Notes
Z-Height Measurement with Noncontact Sensors
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Spindle Measurement
