QuikApps — Fabric or Film Density

Nonwoven fabrics can contain changes in density that affect quality of the final product. Density can be monitored with a capacitive sensor if the thickness of the material is controlled.

During processing of the fabric, the thickness is either controlled or measured by a secondary process. A capacitive probe looking through the fabric at a reference target will respond to changes in the density of the fabric. The sensor output can alert and operator or be fed back into a servo system to control the process.

Diagram

USEFUL LINKS

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Z-HEIGHT MEASUREMENT FOR SCANNING ELECTRON MICROSCOPES CASE STUDY

Z-HEIGHT DETECTION FOR BACKSIDE SEMICONDUCTOR WAFER INSPECTION CASE STUDY

SEMI SILICON WAFER THICKNESS CASE STUDY